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Model | TS7600 | TS7700 | |
Optical Geometry | Reflect: di:8°, de:8°(diffused illumination, 8-degree viewing angle). SCI (specular component included)/SCE (specular component excluded) ,excluded UV light source. Conforms to CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7. | Reflect: di:8°, de:8°(diffused illumination, 8-degree viewing angle) SCI (specular component included)/SCE (specular component excluded) ; Include UV / excluded UV light source Conforms to CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7 | |
Characteristic | Customized one aperture | double apertures for accurate color analysis and transmission in laboratory | |
It is used for precise color measurement and quality control in plastic electronics, paint and ink, textile and garment printing and dyeing, printing, ceramics and other industries, and for fluorescent sample measurement. | |||
Integrating Sphere Size | Φ40mm | Conforms to CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7 | |
Light Source | Combined full spectrum LED light source | Combined full spectrum LED light source, UV light source | |
Spectrophotometric Mode | Flat Grating | It is used for precise color measurement and quality control in plastic electronics, paint and ink, textile and garment printing and dyeing, printing, ceramics and other industries, and for fluorescent sample measurement. | |
Sensor | Silicon photodiode array (double row 40 groups) | Φ40mm | |
Wavelength Range | 400~700nm | Combined full spectrum LED light source, UV light source | |
Wavelength Interval | 10nm | Flat Grating | |
Semiband Width | 10nm | Silicon photodiode array (double row 40 groups) | |
Measured Reflectance Range | 0-200% | 400~700nm | |
Measuring Aperture | Customized one aperture: MAV:Φ8mm/Φ10mm;SAV:Φ4mm/Φ5mm | MAV:Φ8mm/Φ10mm; SAV:Φ4mm/Φ5mm | |
Specular Component | SCI&SCE | 10nm | |
Color Space | CIE LAB, XYZ, Yxy, LCh,CIE LUV, s-RGB, βxy, Munsell(C/2) | CIE LAB, XYZ, Yxy, LCh, CIE LUV, s-RGB, HunterLab, βxy, DIN Lab99 Munsell(C/2) | |
Color Difference Formula | ΔE*ab,ΔE*uv,ΔE*94,ΔE*cmc(2:1), ΔE*cmc(1:1),ΔE*00 | ΔE*ab,ΔE*uv,ΔE*94,ΔE*cmc(2:1), ΔE*cmc(1:1),ΔE*00, DINΔE99,ΔE(Hunter) | |
Other Colorimetric Index | WI(ASTM E313,CIE/ISO,AATCC,Hunter), YI(ASTM D1925,ASTM 313), Staining Fastness, Color Fastness, Color Strength, Opacity, 8° Glossiness | WI(ASTM E313,CIE/ISO,AATCC,Hunter), YI(ASTM D1925,ASTM 313), Metamerism Index MI, Staining Fastness, Color Fastness, Color Strength, Opacity, 8° Glossiness,555 tone classification | |
Observer Angle | 2°/10° | CIE LAB,XYZ,Yxy,LCh,CIE LUV,s-RGB,HunterLab,βxy,DIN Lab99 Munsell(C/2) | |
Illuminant | D65,A,C,D50,F2(CWF),F7(DLF),F10(TPL5),F11(TL84),F12(TL83/U30) | D65,A,C,D50,D55,D75,F1,F2(CWF),F3,F4,F5,F6,F7(DLF),F8,F9,F10(TPL5),F11(TL84),F12(TL83/U30) | |
Displayed Data | Spectrogram/Values, Samples Chromaticity Values, Color Difference Values/Graph, PASS/FAIL Result, Color Offset | Spectrogram/Values, Samples Chromaticity Values, Color Difference Values/Graph, PASS/FAIL Result, Color Offset | |
Measuring Time | About 1.5s (Measure SCI & SCE about 3.2s) | YI(ASTM D1925,ASTM 313), | |
Repeatability | Spectral reflectance: MAV/SCI, Standard deviation within 0.1% (400 nm to 700 nm: within 0.2%) | Spectral reflectance: MAV/SCI, Standard deviation within 0.08% (400 nm to 700 nm: within 0.18%) | |
Chromaticity value: MAV/SCI, within ΔE*ab 0.04 ( When a white calibration plate is measured 30 times at 5 second intervals after white calibration) | Chromaticity value: MAV/SCI, within ΔE*ab 0.02 ( When a white calibration plate is measured 30 times at 5 second intervals after white calibration) | ||
Inter-instrument Error | MAV/SCI, Within ΔE*ab 0.2 (Average for 12 BCRA Series II color tiles) | MAV/SCI, Within ΔE*ab 0.15 (Average for 12 BCRA Series II color tiles) | |
Measurement Mode | Single Measurement, Average Measurement(2-99times) | ||
Locating Method | Camera Locating,stabilizer cross position | ||
Dimension | L*W*H=129X76X217mm | D65,A,C,D50,D55,D75,F1,F2(CWF),F3,F4,F5,F6,F7(DLF),F8,F9,F10(TPL5),F11(TL84),F12(TL83/U30) | |
Weight | Approx 600g | Spectrogram/Values, Samples Chromaticity Values, Color Difference Values/Graph, PASS/FAIL Result, Color Offset | |
Battery | 3.7V,5000mAh Li-ion battery, 6000 measurements within 8 hours | About 1.5s (Measure SCI & SCE about 3.2s) | |
Illuminant Life Span | 5 years, more than 3 million times measurements | Spectral reflectance: MAV/SCI, Standard deviation within 0.08% (400 nm to 700 nm: within 0.18%) | |
Displayed Data | 3.5-inch TFT color LCD, Capacitive Touch Screen | Chromaticity value: MAV/SCI, within ΔE*ab 0.02 ( When a white calibration plate is measured 30 times at 5 second intervals after white calibration) | |
Data Port | USB | USB, Bluetooth 4.2 | |
Data Storage | Standard 1000 Pcs, Sample 20000 Pcs | Standard 1000 Pcs, Sample 30000 Pcs | |
Language | Simplified Chinese, English, traditional Chinese or customized | ||
Operating Environment | 0~40℃, 0~85%RH (no condensing), Altitude < 2000m | L*W*H=129X76X217mm | |
Storage Environment | -20~50℃, 0~85%RH (no condensing) | Approx 600g | |
Standard Accessory | Power Adapter, User Guide, PC Software(Download from office website), USB cable, White and Black Calibration Cavity, Protective Cover, Wrist strap, One aperture (8mm or 4mm) | Power Adapter, User Guide, PC Software(Download from office website), USB cable, White and Black Calibration Cavity, Protective Cover, Wrist strap, 8mm flat aperture, 8mm tip aperture, 4mm flat aperture, 4mm tip aperture | |
Optional Accessory | Micro Printer, Powder Test Box | 5 years, more than 3 million times measurements | |
Notes | The specifications are subject to change without notice. | 3.5-inch TFT color LCD, Capacitive Touch Screen | |

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