Drawell DW EDX3000 All Precious Metals in gold jewelries XRF Gold Tester Price
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- Supplier: Chongqing Drawell Technology Co. Ltd.
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Product Overview
Description
Energy Dispersive X-Ray Fluorescence Spectrometer
(for all precious metals in gold jewelries）DW-EDX3000
Excitation Principle
DW-EDX3000 uses X-ray beam from X-ray tube to irradiate the sample, and the element atoms will be excited and emit the secondary X-ray fluorescence characteristic for its own energy. Then these elements get identified and its content measured. The working principle is as follows:
Measurement precision | 0.05%(≥96%) |
Analysis range | 1ppm-99.99% |
Analytical range of elements | More than 60 elements from potassium (K) to uranium (U) |
Measuring object | powder, solid and liquid |
Measurement time | (60~300)s |
Ambient temperature range | (15-30)t) |
Relative humidity | W70% |
Weight | 30kg |
Working voltage | AC 110V/220V |
Configuration | Single sample chamber |
Si PIN semiconductor detector | |
Amplifier circuit | |
High and low voltage power supplies | |
X-ray tube | |
Non-vacuum chamber |
Characteristic X-radiation of element
Each element will emit X-ray at its own energy level when excited. This X-ray is characteristic and called X-ray fluorescence. It is the foundation of analysis.
Scattering
It is the background of spectrum.
Photoelement
The photoelectron is the foundation of detector. In the sample, the X-ray intensity of every element is expressed as I1,I2,I3,I4,I5......respectively. The clement content C is the function of X-ray fluorescence intensity I, expressed as follows:
C=F (I1,I2+I3+I4+I5……)
This equation is too complicated and can be simplified as:\t
C=KlI1+KI2+KI3+K4I4+K5I5……
Where
C is the element content in the sample; I1,I2,I3,I4,I5......arc X-ray intensity of element respectively; K1,K2, K3.K4,K5\tare coefficients which can be determined by measuring known standard sample to calibrate.
Each element will emit X-ray at its own energy level when excited. This X-ray is characteristic and called X-ray fluorescence. It is the foundation of analysis.
Scattering
It is the background of spectrum.
Photoelement
The photoelectron is the foundation of detector. In the sample, the X-ray intensity of every element is expressed as I1,I2,I3,I4,I5......respectively. The clement content C is the function of X-ray fluorescence intensity I, expressed as follows:
C=F (I1,I2+I3+I4+I5……)
This equation is too complicated and can be simplified as:\t
C=KlI1+KI2+KI3+K4I4+K5I5……
Where
C is the element content in the sample; I1,I2,I3,I4,I5......arc X-ray intensity of element respectively; K1,K2, K3.K4,K5\tare coefficients which can be determined by measuring known standard sample to calibrate.
Element | Content(%) | Element | Contenl(%) |
Cr | 0.001 | Fe | 0.001 |
Ru | 2.011 | Ni | 0.218 |
Rh | 13.25 | Co | 0.011 |
Pd | 10.125 | Cu | 0.207 |
Ag | 0.781 | Zn | 0.221 |
Ir | 3.104 | Au | 2.302 |
Pt | 77.816 | In | 2.011 |
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