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  • ADIKERS analog and digital electronic trainer tps3331 logic gates trainer kit logic trainer board on counter and shift register
ADIKERS analog and digital electronic trainer tps3331 logic gates trainer kit logic trainer board on counter and shift register
ADIKERS analog and digital electronic trainer tps3331 logic gates trainer kit logic trainer board on counter and shift register
ADIKERS analog and digital electronic trainer tps3331 logic gates trainer kit logic trainer board on counter and shift register
ADIKERS analog and digital electronic trainer tps3331 logic gates trainer kit logic trainer board on counter and shift register
ADIKERS analog and digital electronic trainer tps3331 logic gates trainer kit logic trainer board on counter and shift register
ADIKERS analog and digital electronic trainer tps3331 logic gates trainer kit logic trainer board on counter and shift register
ADIKERS analog and digital electronic trainer tps3331 logic gates trainer kit logic trainer board on counter and shift register

ADIKERS analog and digital electronic trainer tps3331 logic gates trainer kit logic trainer board on counter and shift register

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Product Overview

Description









– The device provides a variety of signal sources; locking sockets; Taiwanese breadboards;
– The front side is printed with character lines, the back side is installed with components, and all signal source frequency meters and other circuits are composed of CPLD chips and double-sided boards;


Analog experiment
– Logic function and test experiment of gate circuit 
– Combinatorial logic circuit (half adder, full adder and logic operation) experiment 
– Trigger Experiment R – S, D, JK – Tri-state output flip-flops, latches for flip-flop experiments 
–Sequential circuit testing and research 
– Integrated counter and register experiment 
– Decoder and data selector experiments 
–Waveform generator and monostable trigger experiment 
–555 time base circuit experiment 
– Transistor switching characteristics, limiter and clamper experiments 
– TTL gate circuit parameter test experiment 
– CMOS gate circuit test experiment A/D, D/A conversion circuit experiment
 Digital experiment
 – Logic function and test experiment of gate circuit 
– Combinatorial logic circuit (half adder, full adder and logic operation) experiment 
– Trigger Experiment R – S, D, JK – Tri-state output flip-flops, latches for flip-flop experiments 
–Sequential circuit testing and research 
– Integrated counter and register experiment 
– Decoder and data selector experiments 
–Waveform generator and monostable trigger experiment 
–555 time base circuit experiment








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