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Model | AE-XRD-2700A | AE-XRD-2700B | |
Rated power | 3kW(High frequency high voltage control technology) | 4kW | |
Tube voltage | 10-60kV | ||
Tube current | 5-50mA | 5-80mA | |
X-ray tube | Metal ceramic tube Target maretial: Cu, Fe, Co, Cr, Mo etc. Power:2.4kW | ||
Focus size | 1*10mm, 0.4*14mm or 2*12mm | ||
Stability | ≤0.005% | ≤0.01% | |
Goniometer structure | Sample level (θ-θ) | ||
Radius of diffraction | 225mm (or custom by request : 150-285 range) | ||
2θ Scanning range | -6 -160° (θs: -3 - 80°, θd: -3 - 80°) | ||
Scanning speed | 0.0012° - 50°/min | ||
Angle locating speed | 1500°/min | ||
Scanning fashion | θs/θd dlinkage/single action: continuous, stepping and Omg | ||
Minimal stepping angle | 1/10000° | ||
Angle repeatable accuracy | 1/10000° | ||
2θ Angular linearity | International standard sample (SI.Al203), the angle deviation of all peak in full pectrum are not mare than ±0.02° | ||
Detector | Proportional counters(PCjor scintillation counter(SC), Silicon drift detector(SDD),High speed one-dimensional semiconductor array detector | ||
Maximal counting rate of linearity | 5*105CPS (PC.SC with the compensate function of drop out counting) 15* 104(SDD) 9× 102 (one-dimensional array) | ||
Energy resolution ratio | ≤25%(PC, one-dimensional array), ≤50%(SC), ≤200eV(SDD) | ||
Counting fashion | Differential coefficient or integral, PHA automatically, dead time regulate | ||
Stability of system measure | ≤0.01% | ||
Scattered rays dose | ≤1μ Sv/h (without X-ray protective device) | ||
Instrument integrative stability | ≤0.1% | ≤0.5% | |
Figure size | 1000*800*1600mm | ||






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