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Model | TS8210 | TS8260 | TS8450 | TS8280 | TS8290 | ||||
Lighting style | D/8 (diffuse illumination, 8° direction reception) | 45/0 (45 annular uniform illumination 0° reception) | D/8 (diffuse illumination, 8° direction reception) | ||||||
Integrating sphere size | Φ40mm | Φ152mm | Φ152mm | ||||||
Illumination light source | Combined full-spectrum LED light source | ||||||||
Spectroscopic method | Planar grating splitting | ||||||||
inductor | Silicon photodiode array (dual row 40 groups) | 256-pixel dual-array CMOS image sensor | Silicon photodiode array (dual row 40 groups) | ||||||
Wavelength range measurement | 400~700nm | ||||||||
Wavelength spacing | 10nm | ||||||||
Semi-bandwidth | 10nm | ||||||||
Reflectance measurement range | 0~200% | ||||||||
Measure the caliber | MAV:Φ8mm/Φ10mm;SAV:Φ4mm/Φ5mm | MAV:Φ25.4mm/Φ30mm;SAV:Φ8mm/Φ10mm | Φ30mm/Φ25.4mm | ||||||
Light-containing method | simultaneously testing SCI/SCE | 45/0 | simultaneously testing SCI/SCE | ||||||
Color space | CIE LAB,XYZ,Yxy,LCh,CIE LUV,s-RGB,βxy,Munsell(C/2) | ||||||||
Chromatic aberration formula | ΔE*ab,ΔE*uv,ΔE*94,ΔE*cmc(2:1),ΔE*cmc(1:1),ΔE*00 | ||||||||
Observer perspective | 2°/10° | ||||||||
Observe light source | D65,A,C,D50,D55,D75,F1,F2(CWF),F3,F4,F5,F6,F7(DLF),F8,F9,F10(TPL5),F11(TL84),F12(TL83/U30) | ||||||||




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