BEST PRODUCT of HETTC,TEACHING EQUIPMENT, ELECTRONICS TRAINING KIT,ANALOG CIRCUIT TEST BOX HDK AET01
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- Supplier: Shandong Hettc Intelligent Technology Co. Ltd.
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Product Overview
Description
Product Overview
BEST PRODUCT of HETTC,TEACHING EQUIPMENT, ELECTRONICS TRAINING KIT,ANALOG CIRCUIT TEST BOX HDK-AET01
HDK-AET01 analog circuit test box is a basic analog electronic technology teaching equipment, including breadboard, common power and signal sources, basic components (resistors, capacitors and inductors), basic semiconductor devices such as diodes,transistors, field effect tubes, single junction transistors, thyristors, photocouplers and relays. All components have experimental jacks, which can be freely connected for experiments. Students can not only be familiar with common components and understand their characteristics, but also build their own circuit to complete the experiment, which not only exercises students' hands-on ability but also learns relevant electronic knowledge.
FEATURES AT A GLANCE
DIDACTIC TRAINING EQUIPMENT
ELECTRONICS TRAINING EQUIPMENTELECTRONICS TRAINING KIT
TRAINING BOX
DURABLE
EASY FOR DELIVERY
1 YEAR WARANTY
PRODUCT PARAMETERS
2.Equipment technical parameters
2.1 Dimensions: 500×340×165 mm, weight: 5.5Kg
2.2 Power supply: single-phase power supply, AC220V, frequency 50/60Hz, power ≤50VA
2.3 With power supply indication, power supply indication, grounding protection, overcurrent protection
2.4 Working environment: temperature -10℃ ~ +40℃
3.Experimental power supply technical parameter
3.1 DC ±5V voltage source, capacity 1A
3.2 DC ±12V voltage source, capacity 1A
3.3 AC 8V voltage source, capacity 1A
3.4 AC 12V voltage source with a capacity of 1A
3.5 Adjustable 0 to ±12V DC voltage source with a capacity of 1A
3.6 Signal generator:: 100 ~ 100KHz, amplitude 10V
2.1 Dimensions: 500×340×165 mm, weight: 5.5Kg
2.2 Power supply: single-phase power supply, AC220V, frequency 50/60Hz, power ≤50VA
2.3 With power supply indication, power supply indication, grounding protection, overcurrent protection
2.4 Working environment: temperature -10℃ ~ +40℃
3.Experimental power supply technical parameter
3.1 DC ±5V voltage source, capacity 1A
3.2 DC ±12V voltage source, capacity 1A
3.3 AC 8V voltage source, capacity 1A
3.4 AC 12V voltage source with a capacity of 1A
3.5 Adjustable 0 to ±12V DC voltage source with a capacity of 1A
3.6 Signal generator:: 100 ~ 100KHz, amplitude 10V
PRODUCT COMPOSITION
4.1 The panel of the test box includes the area of the test power supply, breadboard and discrete components.
- Power supplies include DC power supplies and AC power supplies. Dc power supplies include adjustable voltage sources and constant voltage sources.
Basic components include resistors of different powers, inductors, polar and non-polar capacitors, potentiometers, NTC, PTC, LDR, relays and photocouplers.
- Diodes include silicon diodes, germanium diodes, fast diodes, Zener diodes, varactor diodes, light emitting diodes, Schottky
diodes.
- Transistors include common transistor, junction FET, insulated gate FET, single junction transistor and bipolar transistor.
- Power components include bidirectional thyristors, thyristors, and insulated gate bipolar transistors.
4.2 Accessories of the experiment box
- power cable 1 pcs
- K2 jumper cables 50pcs
- user manual
- Power supplies include DC power supplies and AC power supplies. Dc power supplies include adjustable voltage sources and constant voltage sources.
Basic components include resistors of different powers, inductors, polar and non-polar capacitors, potentiometers, NTC, PTC, LDR, relays and photocouplers.
- Diodes include silicon diodes, germanium diodes, fast diodes, Zener diodes, varactor diodes, light emitting diodes, Schottky
diodes.
- Transistors include common transistor, junction FET, insulated gate FET, single junction transistor and bipolar transistor.
- Power components include bidirectional thyristors, thyristors, and insulated gate bipolar transistors.
4.2 Accessories of the experiment box
- power cable 1 pcs
- K2 jumper cables 50pcs
- user manual
MAIN FUNCTION EXPERIMENTS
5. Experimental projects
5.1 Use and connection of measuring instruments
5.2 Basic components resistance, capacitance, inductance and potentiometer measurement and working principle research
5.3 Basic components Research on the working principle of relays and optocouplers
5.4 Ohm's Law experiment
5.5 Kirchhoff's voltage and current law experiments
5.6 Partial pressure and shunt rule experiment
5.7 Thevenin's Law experiment
5.8 NORTON Theorem experiment
5.9 Conceptual understanding experiment of impedance
5.10 Research and application of diode characteristics
5.11 Research and application of transistor characteristics
5.12 Research and application of field effector characteristics
5.13 Research and application of single crystal and thyristor characteristics
5.14 Research and application of photoelectric circuits
5.15 Full wave and half wave rectification experiments
5.16 Filtering experiment
5.17 Voltage regulation and voltage doubling experiments
5.18 Simple logic gate experiment
5.19 Frequency characteristic experiment of resistance inductance capacitor
5.20 Research experiment of DC RC circuit
5.21 Research and experiment of DC RL circuit
5.22 RC, RL, RLC series and parallel resonance experiments
5.1 Use and connection of measuring instruments
5.2 Basic components resistance, capacitance, inductance and potentiometer measurement and working principle research
5.3 Basic components Research on the working principle of relays and optocouplers
5.4 Ohm's Law experiment
5.5 Kirchhoff's voltage and current law experiments
5.6 Partial pressure and shunt rule experiment
5.7 Thevenin's Law experiment
5.8 NORTON Theorem experiment
5.9 Conceptual understanding experiment of impedance
5.10 Research and application of diode characteristics
5.11 Research and application of transistor characteristics
5.12 Research and application of field effector characteristics
5.13 Research and application of single crystal and thyristor characteristics
5.14 Research and application of photoelectric circuits
5.15 Full wave and half wave rectification experiments
5.16 Filtering experiment
5.17 Voltage regulation and voltage doubling experiments
5.18 Simple logic gate experiment
5.19 Frequency characteristic experiment of resistance inductance capacitor
5.20 Research experiment of DC RC circuit
5.21 Research and experiment of DC RL circuit
5.22 RC, RL, RLC series and parallel resonance experiments
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